Dynamically Embedded Latent Feature Analysis for Plant-Wide Troubleshooting
“Dynamically Embedded Latent Feature Analysis for Plant-Wide Troubleshooting

 

Our School Dean Prof S. Joe Qin and Assistant Professor Dr Dong Yining won the "Best Paper Award" at The 3rd International Conference on Industrial Artificial Intelligence (IAI 2021).

 

Out of 206 papers, two papers have been awarded the "Best Paper Award". The award-winning paper also included another student author from the University of South California.

 

Best Paper Award

 

Click HERE to view the paper.